2451 search results - page 105 / 491 » Alternative Test Methods Using IEEE 1149.4 |
CSFW
2002
IEEE
14 years 2 months ago
2002
IEEE
We describe a protocol design process, and illustrate its use by creating ATSPECT, an Authentication Test-based Secure Protocol for Electronic Commerce Transactions. The design pr...
ICCD
2004
IEEE
14 years 6 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
ICML
2005
IEEE
14 years 10 months ago
2005
IEEE
We develop a novel multi-class classification method based on output codes for the problem of classifying a sequence of amino acids into one of many known protein structural class...
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...