2451 search results - page 25 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
VTS
2003
IEEE
14 years 28 days ago
2003
IEEE
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 9 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...