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» Alternative Test Methods Using IEEE 1149.4
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ITC
1999
IEEE
59views Hardware» more  ITC 1999»
14 years 3 hour ago
Static component interconnection test technology in practice
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
Frans De Jong, Rob Raaijmakers
ITC
1989
IEEE
70views Hardware» more  ITC 1989»
13 years 11 months ago
The Pseudo-Exhaustive Test of Sequential Circuits
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
Sybille Hellebrand, Hans-Joachim Wunderlich
DELTA
2008
IEEE
13 years 9 months ago
Test Set Stripping Limiting the Maximum Number of Specified Bits
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but explo...
Michael A. Kochte, Christian G. Zoellin, Michael E...
DATE
2008
IEEE
131views Hardware» more  DATE 2008»
14 years 2 months ago
Optimal High-Resolution Spectral Analyzer
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
A. Tchegho, Heinz Mattes, Sebastian Sattler
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
13 years 12 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout