2451 search results - page 64 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
We provide a general formulation for the code-based test compression problem with fixed-length input blocks and propose a solution approach based on Evolutionary Algorithms. In c...
ICTAI
2002
IEEE
14 years 21 days ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
ISMVL
2005
IEEE
14 years 1 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
VTS
2002
IEEE
14 years 20 days ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...