248 search results - page 15 / 50 » An Analog Leaf Cell for Analog Circuit Design |
INTEGRATION
2010
13 years 5 months ago
2010
1 — This paper presents a new design automation tool based on a modified genetic algorithm kernel, in order to increase efficiency on the analog circuit and system design cycle. ...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
DAC
2003
ACM
14 years 17 days ago
2003
ACM
A new methodology is presented to solve a strongly nonlinear circuit, characterized by Piece-Wise Linear (PWL) functions, symbolically and explicitly in terms of its circuit param...
VLSID
2010
IEEE
13 years 11 months ago
2010
IEEE
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model [15]. As a sequel to our recent work [14], where circ...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...