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CIKM
1993
Springer
13 years 12 months ago
Collection Oriented Match
match algorithms that can efficiently handleAbstract complex tests in the presence of large amounts of data. Match algorithms that are capable of handling large amounts of On the o...
Anurag Acharya, Milind Tambe
ICALP
1989
Springer
13 years 11 months ago
Causal Trees
Category theory has been successfully employed to structure the confusing setup of models and equivalences for concurrency: Winskel and Nielsen have related the standard models nc...
Philippe Darondeau, Pierpaolo Degano
AMOST
2007
ACM
13 years 11 months ago
Achieving both model and code coverage with automated gray-box testing
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Till...
ASPDAC
2007
ACM
164views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Thermal-Aware 3D IC Placement Via Transformation
- 3D IC technologies can help to improve circuit performance and lower power consumption by reducing wirelength. Also, 3D IC technology can be used to realize heterogeneous system-...
Jason Cong, Guojie Luo, Jie Wei, Yan Zhang
ASPDAC
2007
ACM
123views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Coupling-aware Dummy Metal Insertion for Lithography
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
Liang Deng, Martin D. F. Wong, Kai-Yuan Chao, Hua ...
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