39 search results - page 5 / 8 » An Automatic Test Pattern Generator for Large Sequential Cir... |
INTEGRATION
2006
13 years 8 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
VTS
2002
IEEE
14 years 1 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
CODES
2000
IEEE
14 years 29 days ago
2000
IEEE
In current design practice synthesis tools play a key role, letting designers to concentrate on the specificationof the system being designed by carrying out repetitive tasks such...