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» An Effective Diagnosis Method to Support Yield Improvement
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ITC
2002
IEEE
98views Hardware» more  ITC 2002»
14 years 12 days ago
An Effective Diagnosis Method to Support Yield Improvement
Camelia Hora, Rene Segers, Stefan Eichenberger, Ma...
ETS
2007
IEEE
110views Hardware» more  ETS 2007»
14 years 1 months ago
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement
— A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis results. This algorithm effectively overcomes the inherent ambiguities in logic diagno...
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin...
SLIP
2005
ACM
14 years 1 months ago
Multilevel full-chip routing with testability and yield enhancement
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
Katherine Shu-Min Li, Chung-Len Lee, Yao-Wen Chang...
BMCBI
2010
135views more  BMCBI 2010»
13 years 7 months ago
Delineation of amplification, hybridization and location effects in microarray data yields better-quality normalization
Background: Oligonucleotide arrays have become one of the most widely used high-throughput tools in biology. Due to their sensitivity to experimental conditions, normalization is ...
Marc Hulsman, Anouk Mentink, Eugene P. van Someren...
ICCD
2005
IEEE
124views Hardware» more  ICCD 2005»
14 years 4 months ago
Accurate Diagnosis of Multiple Faults
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...
Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng