107 search results - page 7 / 22 » An Experimental Evaluation of Inspection and Testing for Det... |
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
ICCD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
AUTOMATICA
2006
13 years 7 months ago
2006
Given a number of possibly concurrent faults (and disturbances) that may affect a nonlinear dynamic system, it may not be possible to solve the standard fault detection and isolat...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...