1563 search results - page 56 / 313 » An Increase In Value |
ISCA
2005
IEEE
14 years 3 months ago
2005
IEEE
Increased power densities (and resultant temperatures) and other effects of device scaling are predicted to cause significant lifetime reliability problems in the near future. In...
ICCD
2003
IEEE
14 years 6 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
FCS
2006
13 years 11 months ago
2006
- There is continuing research interest in comparison of the complexity of problems within the class NP-Complete. This paper examines the representational power of conjunctive norm...
CORR
2008
Springer
13 years 10 months ago
2008
Springer
The TCP window size process appears in the modeling of the famous Transmission Control Protocol used for data transmission over the Internet. This continuous time Markov process t...
ISPDC
2005
IEEE
14 years 3 months ago
2005
IEEE
The support on cluster environments of ”legacy protocols” is important to avoid rewriting the code of applications, but this support should not prevent to achieve the maximum ...