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ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
HICSS
2005
IEEE
14 years 1 months ago
2005
IEEE
Achieving goals of better integrated and responsive government services requires moving away from stand alone applications toward more comprehensive, integrated architectures. As ...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
ASPDAC
2009
ACM
14 years 2 months ago
2009
ACM
Abstract— In the context of a design space exploration framework for supporting the platform-based design approach, we address the problem of robustness with respect to manufactu...
CCE
2006
13 years 7 months ago
2006
This paper discusses the development of a set of object-oriented modular simulation tools for solving lumped and spatially distributed models generated from chemical process desig...