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EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
13 years 11 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...
GECCO
2005
Springer
121views Optimization» more  GECCO 2005»
14 years 1 months ago
New evolutionary techniques for test-program generation for complex microprocessor cores
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
Ernesto Sánchez, Massimiliano Schillaci, Ma...
CASES
2007
ACM
13 years 11 months ago
SCCP/x: a compilation profile to support testing and verification of optimized code
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
Raimund Kirner
GECCO
2007
Springer
209views Optimization» more  GECCO 2007»
14 years 1 months ago
Kernel based automatic clustering using modified particle swarm optimization algorithm
This paper introduces a method for clustering complex and linearly non-separable datasets, without any prior knowledge of the number of naturally occurring clusters. The proposed ...
Ajith Abraham, Swagatam Das, Amit Konar
ACL
2003
13 years 9 months ago
Feedback Cleaning of Machine Translation Rules Using Automatic Evaluation
When rules of transfer-based machine translation (MT) are automatically acquired from bilingual corpora, incorrect/redundant rules are generated due to acquisition errors or trans...
Kenji Imamura, Eiichiro Sumita, Yuji Matsumoto