In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
This paper introduces a method for clustering complex and linearly non-separable datasets, without any prior knowledge of the number of naturally occurring clusters. The proposed ...
When rules of transfer-based machine translation (MT) are automatically acquired from bilingual corpora, incorrect/redundant rules are generated due to acquisition errors or trans...