913 search results - page 58 / 183 » An Optimal Algorithm for the Automatic Generation of March T... |
CEC
2005
IEEE
14 years 2 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
ICANNGA
2009
Springer
14 years 22 days ago
2009
Springer
A new evolutionary algorithm, Elitistic Evolution (termed EEv), is proposed in this paper. EEv is an evolutionary method for numerical optimization with adaptive behavior. EEv uses...
ICCD
2006
IEEE
14 years 5 months ago
2006
IEEE
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
FORTE
2008
13 years 10 months ago
2008
Network-based fuzz testing has become an effective mechanism to ensure the security and reliability of communication protocol systems. However, fuzz testing is still conducted in a...
VLSID
2002
IEEE
14 years 9 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...