In a CMOS combinational logic circuit, the subthreshold leakage current in the standby state depends on the state of the inputs. In this paper we present a new approach to identif...
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,...
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...