764 search results - page 122 / 153 » An e-contracting reference architecture |
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
VLSID
2008
IEEE
14 years 10 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
VLSID
2005
IEEE
14 years 10 months ago
2005
IEEE
We propose a novel, non-simulative, probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher ord...
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
VLSID
2002
IEEE
14 years 10 months ago
2002
IEEE
CN4011A is IEEE 1394a_2000 standard Compliant Physical Layer ASIC. It is a 0.18um mixed-signal ASIC incorporating three analog ports, PLL, reference generator for analog along wit...