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VLSID
2003
IEEE
96views VLSI» more  VLSID 2003»
14 years 10 months ago
Design Of A Universal BIST (UBIST) Structure
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
VLSID
2003
IEEE
108views VLSI» more  VLSID 2003»
14 years 10 months ago
A Low Power-Delay Product Page-Based Address Bus Coding Method
The working-zone encoding (WZE) method employing locality of memory reference was previously proposed to reduce address bus switching activity. This paper presents an encoding met...
Chi-Ming Tsai, Guang-Wan Liao, Rung-Bin Lin
VLSID
2002
IEEE
142views VLSI» more  VLSID 2002»
14 years 10 months ago
Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, D...
IEEEICCI
2009
IEEE
14 years 4 months ago
The Embodied Communication Prior: A characterization of general intelligence in the context of Embodied social interaction
We outline a general conceptual definition of real-world general intelligence that avoids the twin pitfalls of excessive mathematical generality, and excessive anthropomorphism.. ...
Ben Goertzel
ISPAN
2009
IEEE
14 years 4 months ago
Vector Bank Based Multimedia Codec System-on-a-Chip (SoC) Design
—In this paper, we present a design architecture of implementing a ”Vector Bank” into video encoder system, namely, an H.264 encoder, in order to detect and analyze the movin...
Ruei-Xi Chen, Wei Zhao, Jeffrey Fan, Asad Davari