This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
The working-zone encoding (WZE) method employing locality of memory reference was previously proposed to reduce address bus switching activity. This paper presents an encoding met...
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, D...
We outline a general conceptual definition of real-world general intelligence that avoids the twin pitfalls of excessive mathematical generality, and excessive anthropomorphism.. ...
—In this paper, we present a design architecture of implementing a ”Vector Bank” into video encoder system, namely, an H.264 encoder, in order to detect and analyze the movin...