At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
: Correct functioning of object-oriented software depends upon the successful integration of classes. While individual classes may function correctly, several new faults can arise ...
Shaukat Ali, Lionel C. Briand, Muhammad Jaffar-Ur ...
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...