65 search results - page 5 / 13 » An on Chip ADC Test Structure |
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
Due to high demand for hall sensors mostly in the automotive and industrial applications, development and manufacturing of hall sensors in System-on-Chip (SoC) became more importa...
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...
TODAES
2011
13 years 2 months ago
2011
—In this paper, we present an attack on stream cipher implementations by determining the scan chain structure of the linear feedback shift registers in their implementations. Alt...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...