65 search results - page 9 / 13 » An on Chip ADC Test Structure |
IWANN
2005
Springer
14 years 29 days ago
2005
Springer
In this paper, a fully functional prototype of an asynchronous 4-to-4 Address Event Representation (AER) mapper is presented. AER is an event driven communication protocol original...
BMCBI
2007
13 years 7 months ago
2007
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...
ASYNC
2003
IEEE
14 years 23 days ago
2003
IEEE
The lack of proven mechanisms for transferring data between multiple synchronous islands has been a major impediment for applying globally asynchronous locally synchronous (GALS) ...
ISCAS
2003
IEEE
14 years 22 days ago
2003
IEEE
The design, fabrication and testing of a 5 5 micromachined tactile sensor array for the detection of an extremely small force (micrometer-Newton range) has been discussed. An anis...
ITC
2003
IEEE
14 years 22 days ago
2003
IEEE
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...