135 search results - page 7 / 27 » Analog circuit test based on a digital signature |
VTS
2003
IEEE
14 years 3 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
This paper aims at developing an automated device-level placement for analog circuit design which achieves comparable quality to manual designs by experts. It extracts a set of cl...
ISCAS
2006
IEEE
14 years 3 months ago
2006
IEEE
—This paper introduces a technique to measure and adjust the relative phase of on-chip high speed digital signals using a random sampling technique of inferential statistics. The...
ISPD
2005
ACM
14 years 3 months ago
2005
ACM
Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. With thes...