85 search results - page 11 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
SENSYS
2009
ACM
14 years 2 months ago
2009
ACM
Continuous and reliable operation of WSNs is notoriously difficult to guarantee due to hardware degradation and environmental changes. In this paper, we propose and demonstrate a ...
ISLPED
2007
ACM
13 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
VTS
1999
IEEE
13 years 11 months ago
1999
IEEE
This paper presents adaptive techniques for improving delay fault diagnosis. These techniques reduce the search space for direct probing which can save a lot of time during failur...