85 search results - page 5 / 17 » Analysis and Detection of Timing Failures in an Experimental... |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
GECCO
2007
Springer
14 years 1 months ago
2007
Springer
Standard detection algorithms for nonlinearity linkage fail when applied to typical problems in the analysis of financial time-series data. We explain how this failure arises whe...
IPSN
2010
Springer
14 years 2 months ago
2010
Springer
Troubleshooting unresponsive sensor nodes is a significant challenge in remote sensor network deployments. This paper introduces the tele-diagnostic powertracer, an in-situ troub...
RTSS
2007
IEEE
14 years 1 months ago
2007
IEEE
In the last years, a progressive migration from single processor chips to multi-core computing devices has taken place in the general-purpose and embedded system market. The devel...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...