118 search results - page 7 / 24 » Analysis and Minimization of Test Time in a Combined BIST an... |
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
PTS
2000
13 years 8 months ago
2000
Systems constructed from components, including distributed systems, consist of a number of elements that interact with each other. As the number of network elements or interchangea...
DATE
2004
IEEE
13 years 10 months ago
2004
IEEE
In this paper, we propose an approach to estimate the Worst Case Response Time (WCRT) of tasks in a preemptive multi-tasking single-processor real-time system with a set associati...
DATE
2005
IEEE
14 years 10 days ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
EDBT
2008
ACM
14 years 6 months ago
2008
ACM
Data Stream Management Systems (DSMSs) must support optimized execution scheduling of multiple continuous queries on massive, and frequently bursty, data streams. Previous approac...