As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...
A system-level statistical analysis methodology is described that captures the impact of inter- and intra-die process variations for read timing failures in SRAM circuit blocks. U...
Soner Yaldiz, Umut Arslan, Xin Li, Larry T. Pilegg...
This paper explores an approach to global, stochastic, simulation optimization which combines stochastic approximation (SA) with simulated annealing (SAN). SA directs a search of ...
Simulation models are useful to predict and understand the impact of changes to a manufacturing system. Typical factory simulation models include the parts being manufactured in t...
Jeffrey W. Herrmann, Brian F. Conaghan, Laurent He...
This work describes a forward-looking approach for the solution of dynamic (time-changing) problems using evolutionary algorithms. The main idea of the proposed method is to combi...