: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
Static worst-case execution time (WCET) analysis is done by modeling the hardware behavior. In this paper we describe a WCET analysis technique to analyze systems with function ca...
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
The increasing complexity and software content of embedded systems has led to the common use of sophisticated system software that helps applications use the underlying hardware r...
Robert P. Dick, Ganesh Lakshminarayana, Anand Ragh...