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DAC
2008
ACM
16 years 5 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
112
Voted
DAC
2007
ACM
16 years 5 months ago
Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage
In this paper we address the the growing issue of junction tunneling leakage (Ijunc) at the circuit level. Specifically, we develop a fast approach to analyze the state-dependent ...
Tao Li, Zhiping Yu
120
Voted
DAC
2007
ACM
16 years 5 months ago
Modeling the Function Cache for Worst-Case Execution Time Analysis
Static worst-case execution time (WCET) analysis is done by modeling the hardware behavior. In this paper we describe a WCET analysis technique to analyze systems with function ca...
Raimund Kirner, Martin Schoeberl
DAC
2000
ACM
16 years 4 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2000
ACM
16 years 4 months ago
Power analysis of embedded operating systems
The increasing complexity and software content of embedded systems has led to the common use of sophisticated system software that helps applications use the underlying hardware r...
Robert P. Dick, Ganesh Lakshminarayana, Anand Ragh...