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DATE
2006
IEEE
94views Hardware» more  DATE 2006»
14 years 1 months ago
Large power grid analysis using domain decomposition
: This paper presents a domain decomposition (DD) technique for efficient simulation of large-scale linear circuits such as power distribution networks. Simulation results show th...
Quming Zhou, Kai Sun, Kartik Mohanram, Danny C. So...
ITC
2003
IEEE
108views Hardware» more  ITC 2003»
14 years 1 months ago
Backplane Test Bus Applications For IEEE STD 1149.1
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
Clayton Gibbs
EIT
2008
IEEE
14 years 2 months ago
Use of local biasing in designing analog integrated circuits
—A new biasing technique called “local biasing” of transistors is used to design analog integrated circuit amplifiers, or any other analog ICs. The technique is based on desi...
Reza Hashemian
ISLPED
2003
ACM
149views Hardware» more  ISLPED 2003»
14 years 29 days ago
Elements of low power design for integrated systems
The increasing prominence of portable systems and the need to limit power consumption and hence, heat dissipation in very high density VLSI chips have led to rapid and innovative ...
Sung-Mo Kang
VTS
2002
IEEE
121views Hardware» more  VTS 2002»
14 years 19 days ago
Very Low Voltage Testing of SOI Integrated Circuits
Very Low Voltage (VLV) testing has been proposed to increase flaw detection in bulk silicon CMOS integrated circuits and this paper explores these and additional advantages in the...
Eric MacDonald, Nur A. Touba