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MVA
2007
146views Computer Vision» more  MVA 2007»
13 years 9 months ago
A SVM Based Method to Detect Color Shift Defects in IC Packages
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari
RECOSOC
2007
160views Hardware» more  RECOSOC 2007»
13 years 9 months ago
Stack processor architecture and development methods suitable for dependable applications
Nowadays, reconfigurable and multiprocessor systems are becoming increasingly attractive for many applications. Such systems should be more and more dependable especially if error...
Mehdi Jallouli, Camille Diou, Fabrice Monteiro
CDES
2006
107views Hardware» more  CDES 2006»
13 years 9 months ago
An Algorithm for Yield Improvement via Local Positioning and Resizing
The ability to improve the yield of integrated circuits through layout modification has been recognized and several techniques for yield enhanced routing and compaction have been ...
Vazgen Karapetyan
CSREAESA
2004
13 years 9 months ago
A Distributed FIFO Scheme for System on Chip Inter-Component Communication
Interconnect delays are increasingly becoming the dominant source of performance degradation in the nano-meter regime, largely because the wires do not scale as fast as the device...
Ray Robert Rydberg III, Jabulani Nyathi, Jos&eacut...
SCS
2003
13 years 9 months ago
SIL Rating Fire Protection Equipment
SIL's (Safety Integrity Levels) are used by IEC 61508:1998 [1] to characterise the required functional safety of computer control systems. For example, SIL 4, the highest rat...
Richard M. Robinson, Kevin J. Anderson