1398 search results - page 193 / 280 » Application-Specific Integrated Circuits |
TCAD
2010
13 years 6 months ago
2010
—With the scaling of complementary metal–oxide– semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacit...
ERSA
2009
13 years 5 months ago
2009
Medium-grain reconfigurable hardware (MGRH) architectures represent a hybrid between the versatility of a field programmable gate array (FPGA) and the computational power of a cust...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis. The method is composed of two components. One part is the adaptive sampler that manip...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
We propose a layout-driven test-architecture design and optimization technique for core-based system-on-chips (SoCs) that are fabricated using three-dimensional (3D) integration. ...