1398 search results - page 243 / 280 » Application-Specific Integrated Circuits |
AINA
2009
IEEE
14 years 27 days ago
2009
IEEE
Device centric Service-oriented Architectures have shown to be applicable in the automation industry for interconnecting manufacturing devices and enterprise systems, thus, establ...
DATE
2010
IEEE
14 years 27 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DATE
2010
IEEE
14 years 27 days ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
DATE
2002
IEEE
14 years 23 days ago
2002
IEEE
Abstract—Antenna problem is a phenomenon of plasma-induced gateoxide degradation. It directly affects manufacturability of very large scale integration (VLSI) circuits, especiall...
GLVLSI
2002
IEEE
14 years 23 days ago
2002
IEEE
We present a low-power sine-output Direct Digital Frequency Synthesizer (DDFS) realized in 0.18 µm CMOS that achieves 60 dBc spectral purity from DC to the Nyquist frequency. No ...