Importance sampling is a popular approach to estimate rare event failures of SRAM cells. We propose to improve importance sampling by probability collectives. First, we use “Kul...
Fang Gong, Sina Basir-Kazeruni, Lara Dolecek, Lei ...
In this paper, we propose two methods used in 3D IC placement that effectively exploit the die-to-die thermal coupling in the stack. First, TSVs are spread on each die to reduce t...
Large-scale process variations can significantly limit the practical utility of microelectro-mechanical systems (MEMS) for RF (radio frequency) applications. In this paper we desc...
Fa Wang, Gokce Keskin, Andrew Phelps, Jonathan Rot...
A novel topology for Translinear (TL) loops comprising of CMOS Second Generation Current Conveyors (CC-II) and diodes is proposed. The proposed methodology opens a new paradigm to...
Debashis Dutta, Wouter A. Serdijn, Swapna Banerjee...
Noise can cause digital circuits to switch incorrectly and thus produce spurious results. Noise can also have adverse power, timing and reliability e ects. Dynamic logic is partic...
Andrew R. Conn, Ruud A. Haring, Chandramouli Viswe...