As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
This paper presents a generalized formulation of the periodic steady-state analysis for oscillators. The new formulation finds the value of a circuit parameter that results in a d...
Igor Vytyaz, David C. Lee, Suihua Lu, Amit Mehrotr...
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
Nuno Alexandre Marques, Mattan Kamon, Jacob White,...
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...