1398 search results - page 99 / 280 » Application-Specific Integrated Circuits |
JSA
2000
13 years 8 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
This paper presents a generalized formulation of the periodic steady-state analysis for oscillators. The new formulation finds the value of a circuit parameter that results in a d...
DAC
1998
ACM
14 years 9 months ago
1998
ACM
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
DATE
2009
IEEE
14 years 3 months ago
2009
IEEE
Today’s complex integrated circuit designs increasingly rely on post-silicon validation to eliminate bugs that escape from presilicon verification. One effective silicon debug ...