8982 search results - page 1581 / 1797 » Applications of Aglet Technology |
VLSID
2001
IEEE
14 years 11 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
EDBT
2008
ACM
14 years 11 months ago
2008
ACM
Protection of one's intellectual property is a topic with important technological and legal facets. The significance of this issue is amplified nowadays due to the ease of da...
ICWS
2009
IEEE
14 years 8 months ago
2009
IEEE
: © Mobile In-Store Personalized Services Jun Li, Ismail Ari, Jhilmil Jain, Alan H. Karp, Mohamed; Dekhil HP Laboratories HPL-2009-48 mobile shopping assistant, cross-organization...
ICCAD
2007
IEEE
14 years 7 months ago
2007
IEEE
Modern processing technologies offer a number of types of devices such as high-VT , low-VT , thick-oxide, etc. in addition to the nominal transistor in order to meet system perfor...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...