31 search results - page 5 / 7 » Approximation Approach for Timing Jitter Characterization in... |
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
ASPDAC
2008
ACM
13 years 9 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
ICA
2010
Springer
13 years 8 months ago
2010
Springer
Two-photon calcium imaging is an emerging experimental technique that enables the study of information processing within neural circuits in vivo. While the spatial resolution of th...