— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...