936 search results - page 164 / 188 » Architectural patterns for collaborative applications |
DAC
2002
ACM
14 years 8 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
ANCS
2010
ACM
13 years 5 months ago
2010
ACM
This paper discusses the architecture and performance studies of Datacenter Optical Switch (DOS) designed for scalable and highthroughput interconnections within a data center. DO...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Distributed Software Engineering (DSE) concepts in Computer Science (or Engineering) Degrees are commonly introduced using a hands-on approach mainly consisting of teaching a part...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...