Grid applications need to be fault tolerant, malleable, and migratable. In previous work, we have presented orphan saving, an efficient mechanism addressing these issues for divide...
Conventional processor fault tolerance based on time/space redundancy is robust but prohibitively expensive for commodity processors. This paper explores an unconventional approac...
With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting an...
Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Ve...
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed test of high-speed microprocessors using low-cost testers. We explore the fault diagnos...
As technology scales and the energy of computation continually approaches thermal equilibrium [1,2], parameter variations and noise levels will lead to larger error rates at vario...