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» Architecture and Design of a High Performance SRAM for SOC D...
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DATE
2003
IEEE
124views Hardware» more  DATE 2003»
14 years 1 months ago
A Custom-Cell Identification Method for High-Performance Mixed Standard/Custom-Cell Designs
: Over the years, many design methodologies/tools and layout architectures have been developed for datapath-oriented designs. One commonly used approach for high-speed datapath des...
Jennifer Y.-L. Lo, Wu-An Kuo, Allen C.-H. Wu, Ting...
MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
14 years 1 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
CODES
2004
IEEE
13 years 11 months ago
A loop accelerator for low power embedded VLIW processors
The high transistor density afforded by modern VLSI processes have enabled the design of embedded processors that use clustered execution units to deliver high levels of performan...
Binu K. Mathew, Al Davis
TVLSI
2008
119views more  TVLSI 2008»
13 years 7 months ago
Automatic Design of Reconfigurable Domain-Specific Flexible Cores
Reconfigurable hardware is ideal for use in Systems-on-a-Chip, as it provides both hardware-level performance and post-fabrication flexibility. However, any one architecture is ra...
Katherine Compton, Scott Hauck
DAC
2008
ACM
14 years 9 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego