27 search results - page 3 / 6 » Area-efficient error protection for caches |
TCAD
2008
13 years 7 months ago
2008
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
SIGMETRICS
2011
ACM
12 years 10 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
DATE
2010
IEEE
14 years 16 days ago
2010
IEEE
— Though tag bits in the data caches are vulnerable to transient errors, few effort has been made to reduce their vulnerability. In this paper, we propose to exploit prevalent sa...
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...