396 search results - page 36 / 80 » Argument Controlled Profiling |
CCE
2006
13 years 7 months ago
2006
In the past few years, Rapid Thermal Processes (RTP) have gained acceptance as mainstream technology for semi-conductors manufacturing. These processes are characterized by a sing...
CCS
2009
ACM
14 years 8 months ago
2009
ACM
Inlined Reference Monitor (IRM) is an established enforcement mechanism for history-based access control policies. IRM enforcement injects monitoring code into the binary of an un...
TASE
2008
IEEE
13 years 7 months ago
2008
IEEE
Applications such as layered manufacturing, or in general, solid free-form fabrication, pose a major challenge on online process control. For these parts to be functional, it is i...
ICCD
2007
IEEE
13 years 11 months ago
2007
IEEE
The emerging trend of larger number of cores or processors on a single chip in the server, desktop, and mobile notebook platforms necessarily demands larger amount of on-chip last...
BMCBI
2007
13 years 7 months ago
2007
Background: Microarrays are widely used for the study of gene expression; however deciding on whether observed differences in expression are significant remains a challenge. Resul...