887 search results - page 32 / 178 » Automated Detection of Design Patterns |
ICDAR
2009
IEEE
14 years 2 months ago
2009
IEEE
Detection of characters in scenery images is often a very difficult problem. Although many researchers have tackled this difficult problem and achieved a good performance, it is...
ICDAR
2007
IEEE
13 years 7 months ago
2007
IEEE
This paper is concerned with a universal pattern, which is defined as a character pattern designed to have high machine-readability. This universal pattern is a character pattern...
TOSEM
2002
13 years 7 months ago
2002
d Abstraction of Class Diagrams ALEXANDER EGYED Teknowledge Corporation Designers can easily become overwhelmed with details when dealing with large class diagrams. icle presents a...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
ITC
2002
IEEE
14 years 10 days ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...