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VTS
2005
IEEE
96views Hardware» more  VTS 2005»
14 years 2 months ago
Pseudo-Functional Scan-based BIST for Delay Fault
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
DAC
2002
ACM
14 years 10 months ago
A fast on-chip profiler memory
Profiling an application executing on a microprocessor is part of the solution to numerous software and hardware optimization and design automation problems. Most current profilin...
Roman L. Lysecky, Susan Cotterell, Frank Vahid
SIGSOFT
2004
ACM
14 years 2 months ago
Using an SQL coverage measurement for testing database applications
Many software applications have a component based on database management systems in which information is generally handled through SQL queries embedded in the application code. Wh...
María José Suárez Cabal, Javi...
LICS
2008
IEEE
14 years 3 months ago
The Quest for a Logic Capturing PTIME
The question of whether there is a logic that captures polynomial time is the central open problem in descriptive complexity theory. In my talk, I will review the question and the...
Martin Grohe
ECSQARU
2009
Springer
14 years 1 months ago
Inference from Multinomial Data Based on a MLE-Dominance Criterion
We consider the problem of inference from multinomial data with chances θ, subject to the a-priori information that the true parameter vector θ belongs to a known convex polytope...
Alessio Benavoli, Cassio P. de Campos