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DAC
2006
ACM
14 years 9 months ago
Timing-based delay test for screening small delay defects
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2006
ACM
14 years 9 months ago
High-level power management of embedded systems with application-specific energy cost functions
Most existing dynamic voltage scaling (DVS) schemes for multiple tasks assume an energy cost function (energy consumption versus execution time) that is independent of the task ch...
Youngjin Cho, Naehyuck Chang, Chaitali Chakrabarti...
DAC
2006
ACM
14 years 9 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
DAC
2006
ACM
14 years 9 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
DAC
2006
ACM
14 years 9 months ago
Extending the lifetime of fuel cell based hybrid systems
Fuel cells are clean power sources that have much higher energy densities and lifetimes compared to batteries. However, fuel cells have limited load following capabilities and can...
Jianli Zhuo, Chaitali Chakrabarti, Naehyuck Chang,...