106 search results - page 6 / 22 » Automated data analysis solutions to silicon debug |
EMSOFT
2006
Springer
13 years 10 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
DAC
2002
ACM
14 years 7 months ago
2002
ACM
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovere...
ICST
2010
IEEE
13 years 4 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
VLSID
2006
IEEE
14 years 21 days ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
KI
2007
Springer
14 years 25 days ago
2007
Springer
In this paper we present a continuous 24 hour data collection and a semi automated data analysis of laboratory mice in a spacious indoor environment. The data is collected via an R...