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» Automated debugging in eclipse

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ICSE
2010
IEEE-ACM

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Test generation through programming in UDITA

14 years 2 months ago

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We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...

Milos Gligoric, Tihomir Gvero, Vilas Jagannath, Sa...

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AADEBUG
2005
Springer

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Lightweight bug localization with AMPLE

14 years 3 months ago

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AMPLE locates likely failure-causing classes by comparing method call sequences of passing and failing runs. A diﬀerence in method call sequences, such as multiple deallocation ...

Valentin Dallmeier, Christian Lindig, Andreas Zell...

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SIGSOFT
2010
ACM

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HI-C: diagnosing object churn in framework-based applications

13 years 7 months ago

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In prior work we have developed an escape analysis to help developers identify sources of object churn (i.e., excessive use of temporaries) in large framework-based applications. ...

Marc Fisher II, Luke Marrs, Barbara G. Ryder

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DAC
2000
ACM

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Efficient error detection, localization, and correction for FPGA-based debugging

14 years 10 months ago

Download www.cs.ucla.edu

John Lach, William H. Mangione-Smith, Miodrag Potk...

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