27 search results - page 5 / 6 » Automated microprocessor stressmark generation |
DAC
2002
ACM
14 years 9 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
DAC
2005
ACM
14 years 9 months ago
2005
ACM
Channel estimation and multiuser detection are enabling technologies for future generations of wireless applications. However, sophisticated algorithms are required for accurate c...
FCCM
2006
IEEE
14 years 2 months ago
2006
IEEE
Current Radio Frequency Identification (RFID) systems generally have long design times and low tolerance to changes in specification. This paper describes a field programmable,...
DAC
2007
ACM
14 years 15 days ago
2007
ACM
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
DAC
2009
ACM
14 years 9 months ago
2009
ACM
Computational complexity has been the primary challenge of many VLSI CAD applications. The emerging multicore and manycore microprocessors have the potential to offer scalable perf...