872 search results - page 5 / 175 » Automatic Generation of Detection Algorithms for Design Defe... |
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Model-based development is becoming an increasingly common development methodology. In important domains like embedded systems already major parts of the code are generated from m...
AHS
2006
IEEE
14 years 1 months ago
2006
IEEE
The paper presents a novel integrated system in which a number of image processing algorithm are embedded within a Genetic Algorithm (GA) based framework in order to provide an ad...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DATE
2002
IEEE
14 years 14 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
IPMI
2005
Springer
14 years 8 months ago
2005
Springer
We propose a technique to accurately correct the spherical topology of cortical surfaces. We construct a mapping from the original surface onto the sphere to detect topological def...