7628 search results - page 65 / 1526 » Automatic Generation of the C |
155
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DAC
1999
ACM
15 years 8 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
109
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
121
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GW
2005
Springer
15 years 10 months ago
2005
Springer
Abstract. In our paper we present a method for the automatic generation of single German Sign Language glosses from German words. Glosses are often used as a textual description of...
149
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QSIC
2003
IEEE
15 years 9 months ago
2003
IEEE
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...
130
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DAC
1997
ACM
15 years 8 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...