315 search results - page 14 / 63 » Automatic generation of high coverage usability tests |
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
ICCAD
2000
IEEE
14 years 5 days ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
TAICPART
2006
IEEE
14 years 1 months ago
2006
IEEE
Testing compositions of web services is complex, due to their distributed nature and asynchronous behaviour. However, research in this field is scarce. We propose a new testing me...
IOLTS
2000
IEEE
14 years 4 days ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...