315 search results - page 18 / 63 » Automatic generation of high coverage usability tests |
GI
2009
Springer
13 years 5 months ago
2009
Springer
Abstract: This paper presents a new approach to Automatic GUI Test Case Generation and Validation: a use case-guided technique to reduce the effort required in GUI modeling and tes...
ICCAD
1994
IEEE
13 years 12 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
CGO
2005
IEEE
14 years 1 months ago
2005
IEEE
Program execution traces are frequently used in industry and academia. Yet, most trace-compression algorithms have to be re-implemented every time the trace format is changed, whi...
EVOW
2001
Springer
14 years 8 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
DATE
2000
IEEE
14 years 6 days ago
2000
IEEE
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...