315 search results - page 22 / 63 » Automatic generation of high coverage usability tests |
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
DSD-Crasher is a bug finding tool that follows a three-step approach to program analysis: D. Capture the program’s intended execution behavior with dynamic invariant detection....
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
DATE
2000
IEEE
14 years 6 days ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ET
2000
13 years 7 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...